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IAR Systems In-circuit debugging probes
IAR Systems offer a range of in-circuit debugging probes, covering different needs from initial to more advanced development. The probes are completely integrated with IAR Embedded Workbench, and targeted for simplified, seamless and more flexible development workflows.
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I-jet features automatic core recognition, and direct download into the flash memory of most popular microcontrollers. It has the capability of measuring target power consumption with a high degree of accuracy, and can supply the target boards with power, entirely powered by USB. I-jet is available for microcontrollers based on any ARM core.
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JTAGjet-Trace offers advanced trace functionality for ARM and ARM Cortex-based applications. It can perform trace acquisition of up to 400 MSamples/sec and it has a capture capacity of 18MB in the trace buffer. In addition, it features a Smart Flash Programmer, JTAG chain device detection, and variable and adaptive JTAG clock.
All products are delivered with access to technical support and product maintenance.
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IAR I-jet
In-circuit debugging probe for ARM
I-jet is a slim JTAG hardware debug probe; it connects via USB to the PC host running Windows. I-jet integrates seamlessly into IAR Embedded Workbench and is fully plug-and-play compatible.
Key features
Supports ARM7/ARM9/ARM11 and Cortex-M/R/A cores
Seamless integration into the IAR Embedded Workbench IDE
(IAR Embedded Workbench for ARM version 6.30.8 ... |
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IAR I-scope
I-scope is a small probe that adds current and voltage measurement capabilities to I-jet.
The measurements can be done at any designated points on the target board and are displayed in real-time by the C-SPY Debugger in IAR Embedded Workbench for ARM.
Key features
I-scope measures current and voltages and sends it to I-jet, which synchronizes the data with the progr ... |
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